MULTIPLE-FAULT DETECTION IN FAN-OUT FREE CIRCUITS USING MINIMAL SINGLE FAULT TEST SET

Authors
LAI K LALA PK
Citation
K. Lai et Pk. Lala, MULTIPLE-FAULT DETECTION IN FAN-OUT FREE CIRCUITS USING MINIMAL SINGLE FAULT TEST SET, I.E.E.E. transactions on computers, 45(6), 1996, pp. 763-765
Citations number
11
Categorie Soggetti
Computer Sciences","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture
Journal title
I.E.E.E. transactions on computers → ACNP
ISSN journal
00189340
Volume
45
Issue
6
Year of publication
1996
Pages
763 - 765
Database
ISI
SICI code
0018-9340(1996)45:6<763:MDIFFC>2.0.ZU;2-D
Abstract
This paper presents a new algorithm to generate test sets for single s tuck-at faults, which also detect all multiple stuck-at faults in fan- out-free circuits. This algorithm derives the test set for each node i n a fan-out-free circuit by calculating the output count of the node. The output count indicates the number of test patterns needed to check for all faults in the corresponding subcircuit. The fan-out-free circ uit can be any combination of AND, OR, NOT, NAND, and NOR gates.