CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF STRUCTURE OF BETA-SILICON NITRIDE

Authors
WANG QL YAN YF WANG RH
Citation
Ql. Wang et al., CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF STRUCTURE OF BETA-SILICON NITRIDE, Physica status solidi. a, Applied research, 155(2), 1996, pp. 289-297
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
155
Issue
2
Year of publication
1996
Pages
289 - 297
Database
ISI
SICI code
0031-8965(1996)155:2<289:CESOSO>2.0.ZU;2-E
Abstract
The structure of beta-Si3N4 was investigated using convergent-beam ele ctron diffraction (CBED) technique. Higher-order Laue zone (HOLZ) line patterns of beta-Si3N4 along several typical directions were photogra phed and computer-simulated in kinematic approximation. All simulation s show good agreement with the experimental observation.