P. Chakrabarti et al., EFFECT OF SURFACE-STATES ON THE ELECTRICAL AND OPTICAL CHARACTERISTICS OF INP MIS CAPACITOR, Physica status solidi. a, Applied research, 155(2), 1996, pp. 389-398
The effect of surface states on the electrical and optical characteris
tics of an InP metal-inulator-semiconductor (MIS) capacitor has been s
tudied theoretically. The semi-numerical model presented here examines
the potential of the device for optically controlled applications. Wh
ile the device shows much promise for use as a voltage variable and/or
optically controlled capacitor, its performance is seriously limited
by the property of the interface between InP crystal and insulator fil
m (Al2O3, in this case), where a considerable number of surface states
exist with their energy distribution widely spread throughout the cry
stal forbidden gap.