EFFECT OF SURFACE-STATES ON THE ELECTRICAL AND OPTICAL CHARACTERISTICS OF INP MIS CAPACITOR

Citation
P. Chakrabarti et al., EFFECT OF SURFACE-STATES ON THE ELECTRICAL AND OPTICAL CHARACTERISTICS OF INP MIS CAPACITOR, Physica status solidi. a, Applied research, 155(2), 1996, pp. 389-398
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
155
Issue
2
Year of publication
1996
Pages
389 - 398
Database
ISI
SICI code
0031-8965(1996)155:2<389:EOSOTE>2.0.ZU;2-A
Abstract
The effect of surface states on the electrical and optical characteris tics of an InP metal-inulator-semiconductor (MIS) capacitor has been s tudied theoretically. The semi-numerical model presented here examines the potential of the device for optically controlled applications. Wh ile the device shows much promise for use as a voltage variable and/or optically controlled capacitor, its performance is seriously limited by the property of the interface between InP crystal and insulator fil m (Al2O3, in this case), where a considerable number of surface states exist with their energy distribution widely spread throughout the cry stal forbidden gap.