HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY ON C-60 AND C-70 ULTRATHIN FILMS

Citation
Y. Fujikawa et al., HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY ON C-60 AND C-70 ULTRATHIN FILMS, Surface science, 358(1-3), 1996, pp. 176-179
Citations number
16
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
358
Issue
1-3
Year of publication
1996
Pages
176 - 179
Database
ISI
SICI code
0039-6028(1996)358:1-3<176:HESOCA>2.0.ZU;2-C
Abstract
Vibrational spectra of C-60 and C-70 monolayer films grown on cleaved surfaces of MoS2 have been measured by high-resolution electron energy loss spectroscopy, In the case of a C-60 monolayer film, a dipole-act ive peak, which was not observed in the case of a thick film, was obse rved under the specular reflection condition, This indicates that the symmetry of C-60 molecules is broken by the existence of the surface o f MoS2. The spectrum of C-60 monolayer film under the off-specular ref lection condition, on the other hand, resembles the spectrum of a thic k film, indicating that the lowering of symmetry of C-60 molecules is neither caused by charge transfer nor by chemical bonding between C-60 and MoS2. In the case of C-70, an IR-active mode which has a dipole m oment parallel to the 5-fold axis disappeared in the spectrum taken un der the specular reflection condition, This indicates that the 5-fold axis of C-70 molecules are parallel to the MoS2 surface.