M. Komiyama et al., SIMULATION OF AFM LFM BY MOLECULAR-DYNAMICS - ROLE OF LATERAL FORCE IN CONTACT-MODE AFM IMAGING/, Surface science, 358(1-3), 1996, pp. 222-227
A recently developed atomic force microscopy (AFM) simulator ACCESS (A
FM simulation code for calculating and evaluating surface structures)
has been extended to incorporate the molecular dynamics method. Using
this ACCESS-II, LFM (lateral force microscopy) as well as AFM simulati
ons were performed under dynamic conditions. Lateral forces felt by th
e tip exhibited a behavior that, leads to the typical stick-slip pheno
menon,and their magnitudes are close to that of the vertical force. Th
e role of the lateral forces in contact-mode AFM imaging is discussed.