ENHANCED SIGNAL-TO-BACKGROUND RATIOS IN VOLTAMMETRIC MEASUREMENTS MADE AT DIAMOND THIN-FILM ELECTROCHEMICAL INTERFACES

Citation
Jw. Strojek et al., ENHANCED SIGNAL-TO-BACKGROUND RATIOS IN VOLTAMMETRIC MEASUREMENTS MADE AT DIAMOND THIN-FILM ELECTROCHEMICAL INTERFACES, Analytical chemistry, 68(13), 1996, pp. 2031-2037
Citations number
36
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032700
Volume
68
Issue
13
Year of publication
1996
Pages
2031 - 2037
Database
ISI
SICI code
0003-2700(1996)68:13<2031:ESRIVM>2.0.ZU;2-S
Abstract
Large signal-to-background (S/B) ratios for the Fe(CN)(6)(3-/4-) and I rCl62-/3- redox couples in KCl have been observed in cyclic voltammetr ic measurements made at a conductive diamond thin-film electrode witho ut any conventional surface pretreatment. The S/B ratios were a factor of similar to 16 and 8 larger at diamond than at freshly polished gla ssy carbon (GC) for Fe(CN)(6)(3-/4-) and IrCl62-/3-, respectively. The polycrystalline diamond film, grown on a p-Si(100) substrate, possess ed significant cubic {100} faceting, as evidenced by AFM images, and w as of high quality, as indicated by Raman spectroscopy. The high, degr ee of electrochemical activity without surface pretreatment, the enhan ced S/B ratios, and the excellent response stability demonstrate that diamond might be an attractive new electrode material for electroanaly sis.