M. Zelikson et al., DIRECT DETERMINATION OF THE QUADRATIC ELECTROOPTIC COEFFICIENT IN AN A-SI-H BASED WAVE-GUIDE, Journal of non-crystalline solids, 200, 1996, pp. 107-110
The first direct determination of the quadratic electro-optic coeffici
ent, s, of a-Si:H at lambda = 1.3 mu m from measurements of the electr
o-optic effect in an a-Si:H based waveguide is reported. From 'ac' exp
eriments in which voltage pulses at a frequency of about 500 Hz were u
sed, a direct determination of s yields the value of 2 X 10(-14) (cm/V
)(2). Using this result to interpret the electro-optic effect in 'dc'
experiments, estimates are obtained for the interface charge density a
t the boundary between a:Si-H and a-SiNx:H cladding layers.