HIGH-PRESSURE ELECTRICAL MEASUREMENTS ON GE-TE-SE GLASSES

Citation
S. Murugavel et al., HIGH-PRESSURE ELECTRICAL MEASUREMENTS ON GE-TE-SE GLASSES, High pressure research, 15(1), 1996, pp. 1-7
Citations number
16
Categorie Soggetti
Physics
Journal title
ISSN journal
08957959
Volume
15
Issue
1
Year of publication
1996
Pages
1 - 7
Database
ISI
SICI code
0895-7959(1996)15:1<1:HEMOGG>2.0.ZU;2-E
Abstract
Electrical resistivity measurements have been carried out on bulk Ge-T e-Se glasses in a Bridgman anvil System. The resistivity of the Ge-Te- Se samples is found to decrease continuously with increasing pressure, with the metallization occurring around 8 GPa. Ge20TexSe80-x glasses (10 less than or equal to x less than or equal to 50) with the mean co -ordination number Z(av) = 2.4 exhibit a plateau in resistivity up to about 4 GPa pressure, followed by a continuous decrease to metallic va lues. On the other hand, Ge10TexSe90-x glasses (10 less than or equal to x less than or equal to 40) having Z(av) = 2.2, exhibit a smaller p lateau (only up to 1 GPa), followed by a decrease in resistivity with pressure. This subtle difference in the high pressure resistivity of G e-Te-Se glasses with Z(av) < 2.4 and Z(av) greater than or equal to 2. 4 can be associated with the changes in the local structure of the cha lcogenide glasses with composition.