TRACK FORMATION IN METALS BY ELECTRONIC PROCESSES USING ATOMIC AND CLUSTER IONS

Citation
A. Dunlop et al., TRACK FORMATION IN METALS BY ELECTRONIC PROCESSES USING ATOMIC AND CLUSTER IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 23-25
Citations number
8
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
112
Issue
1-4
Year of publication
1996
Pages
23 - 25
Database
ISI
SICI code
0168-583X(1996)112:1-4<23:TFIMBE>2.0.ZU;2-Y
Abstract
It is shown here that electronic excitation and ionization arising fro m the slowing-down of swift heavy ions can lead to structural modifica tions in some metallic targets as it has been known for a long time in insulators, This damage is always created in the close vicinity of th e projectile path and can exhibit various forms.