FINE-FOCUSING SYSTEM OF INTENSE BEAMS FOR APPLICATION OF ION-INDUCED PLASMA

Authors
SASA K OGURI Y OKAMURA M OKADA M ITO T HAYASHIZAKI N HATTORI T
Citation
K. Sasa et al., FINE-FOCUSING SYSTEM OF INTENSE BEAMS FOR APPLICATION OF ION-INDUCED PLASMA, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 67-70
Citations number
6
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
113
Issue
1-4
Year of publication
1996
Pages
67 - 70
Database
ISI
SICI code
0168-583X(1996)113:1-4<67:FSOIBF>2.0.ZU;2-U
Abstract
For investigations of ion beam-induced plasmas we developed a fine-foc using system. An ion beam of He-4(+) with an energy of 220 keV/amu aft er acceleration through an RFQ-Linac at TTT was focused onto a small s pot area of about 1 mm(2). This beam deposited a specific deposition p ower of about 0.17 GW/g to the target.