DEPTH RESOLVING PHASE-ANALYSIS OF ION-IMPLANTED STAINLESS-STEEL

Citation
G. Walter et al., DEPTH RESOLVING PHASE-ANALYSIS OF ION-IMPLANTED STAINLESS-STEEL, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 167-170
Citations number
11
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
113
Issue
1-4
Year of publication
1996
Pages
167 - 170
Database
ISI
SICI code
0168-583X(1996)113:1-4<167:DRPOIS>2.0.ZU;2-H
Abstract
For a better understanding of the complex process of ion implantation the information on the composition in phases as a function of depth wi thin the implanted area is needed. In the present work a high austenit ic stainless steel of composition Fe62Ni20Cr18 was implanted with 400 keV Eu-151 ions with different doses up to 1.2 x 10(17) ions/cm(2). Th e depth profile of phases was determined by depth selective conversion electron Mossbauer spectroscopy (DCEMS). We observed a martensitic ph ase within a region of depth, that coincides with the elemental depth profile of the implanted Eu measured by Rutherford backscattering spec troscopy. Furthermore in connection with the DCEMS results the strong influence of adsorbate layers on the formation of the depth profile an d phases will be discussed.