W. Gissler et Pn. Gibson, TITANIUM IMPLANTATION INTO BORON-NITRIDE FILMS AND ION-BEAM MIXING OFTITANIUM-BORON NITRIDE MULTILAYERS, Ceramics international, 22(4), 1996, pp. 335-340
Ti-B-N films of various composition and crystalline structure have bee
n synthesized by titanium ion implantation into sub-stoichiometric and
stoichiometric hexagonal boron nitride films. Due to the relatively l
ow penetration depth of Ti+ ions these films can only be prepared with
limited thickness, of the order of several hundred nanometers. Ti-B-N
films were also prepared by ion-beam mixing of multilayer coatings of
the sequence Ti/BN by argon ion bombardment. With these methods, inho
mogeneous coatings with respect to their composition, in particular at
low fluences, were obtained. All films were investigated by glancing
angle X-ray diffraction. SEM, SNMS and ESCA/Auger analysis were also p
erformed on some of the samples. Hardness and Young's modulus were det
ermined by an ultra-low load, depth-sensing nanoindenter. Most of the
results can be understood by examination of the chemical composition a
nd crystalline structure of the films.