OPTICAL PROFILOMETRY OF POLY(METHYLMETHACRYLATE) SURFACES AFTER RESHAPING WITH A SCANNING PHOTOREFRACTIVE KERATECTOMY (SPRK) SYSTEM

Citation
F. Manns et al., OPTICAL PROFILOMETRY OF POLY(METHYLMETHACRYLATE) SURFACES AFTER RESHAPING WITH A SCANNING PHOTOREFRACTIVE KERATECTOMY (SPRK) SYSTEM, Applied optics, 35(19), 1996, pp. 3338-3346
Citations number
19
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
35
Issue
19
Year of publication
1996
Pages
3338 - 3346
Database
ISI
SICI code
0003-6935(1996)35:19<3338:OPOPSA>2.0.ZU;2-1
Abstract
A prototype frequency-quintupled Nd:YAG laser was used with a scanning system to create, on poly(methylmethacrylate)(PMMA) blocks, ablations corresponding to a correction of 6 diopters of myopia by photorefract ive keratectomy. The topography of the ablated samples was measured wi th an optical profilometer to evaluate the smoothness and accuracy of the ablations. The ablation depth was larger than expected. With a 50% to 70% spot overlap, large valley like variations with a maximum peak -to-peak amplitude of 20 mu m were observed. With an 80% spot overlap, the rms surface roughness was 1.3 mu m and the central flattening was 7 diopters. This study shows that optical profilometry can be used to determine precisely the ablation per pulse and the smoothness and acc uracy of surface ablations. Knowing the exact ablation per pulse is ne cessary to produce a smooth and accurate corneal surface by scanning p hotorefractive keratectomy. (C) 1996 Optical Society of America.