P. Vanloevezijn et al., NUMERICAL AND EXPERIMENTAL-STUDY OF DISORDERED MULTILAYERS FOR BROAD-BAND X-RAY REFLECTION, Applied optics, 35(19), 1996, pp. 3614-3619
The effect of layer thickness disorder in periodic multilayers on x-ra
y reflectivity is investigated numerically and experimentally. We pres
ent ensemble calculations, taking into account absorption and interfac
ial roughness. It is demonstrated that layer thickness disorder yields
band broadening and increased integrated reflectivity. For applicatio
ns we concentrate on extrema of the ensembles, giving the highest inte
grated reflectivity. We develop global optimization methods that can a
lso be used to generate specified reflection band structures. In a few
examples, applications of the optimization methods are discussed. To
illustrate the practical applicability of the methods, we compare expe
rimental realizations to the calculation. In one case we achieve a 42%
increase in integrated reflectivity in the 130 Angstrom < lambda < 19
0 Angstrom spectral range with respect to a periodic multilayer with i
ts first-order Bragg peak in the center of that range. Accurate contro
l of layer thicknesses is our main experimental obstacle. (C) 1996 Opt
ical Society of America