WVM - A COMPUTER-PROGRAM FOR THE DETERMINATION OF LATTICE-PARAMETERS AND STRAINS IN THIN-FILMS

Authors
WIEDER T
Citation
T. Wieder, WVM - A COMPUTER-PROGRAM FOR THE DETERMINATION OF LATTICE-PARAMETERS AND STRAINS IN THIN-FILMS, Computer physics communications, 96(1), 1996, pp. 53-60
Citations number
3
Categorie Soggetti
Mathematical Method, Physical Science","Physycs, Mathematical","Computer Science Interdisciplinary Applications
Journal title
Computer physics communications → ACNP
ISSN journal
00104655
Volume
96
Issue
1
Year of publication
1996
Pages
53 - 60
Database
ISI
SICI code
0010-4655(1996)96:1<53:W-ACFT>2.0.ZU;2-7
Abstract
X-ray diffraction provides a method for the determination of the strai n and stress tensor in a polycrystalline sample. The knowledge of the unstrained lattice parameters is a prerequisite to calculate strains f rom measured reflection shifts. For thin films a model exists to find the unstrained lattice parameters and the strain or stress tensor toge ther from the measured reflection positions.