L. Shen et al., HIGH-TEMPERATURE ELECTRICAL-PROPERTIES AND DEFECT CHEMISTRY OF LA2-XCAXCUO4-Y SUPERCONDUCTORS .2. DEFECT STRUCTURE MODELING, Journal of physics and chemistry of solids, 57(12), 1996, pp. 1977-1987
The defect structure of La2-xCaxCuO4-y superconductors was examined by
fitting electrical property and oxygen nonstoichiometry data to a var
iety of models. Those involving charged oxygen vacancies, whether isol
ated or associated, were inadequate for simultaneously describing the
dependence of both properties on doping level and oxygen partial press
ure. Neutral oxygen vacancies and their association with dopants were
invoked, resulting in a successful reconciliation of all existing expe
rimental data. The defect types and configurations can be rationalized
in terms of the bond-mismatch between the (LaO)(2) and CuO2 layers in
the La2CuO4 structure. The defect associates proposed may be responsi
ble for the suppression in T-c relative to the La2-xBaxCuO4-y and La2-
xSrxCuO4-y systems.