PHOTOLUMINESCENCE INTENSITY IN A SEMICONDUCTOR MICROCAVITY

Measurements of the photoluminescence intensity are presented in a sem iconductor microcavity showing the strong coupling regime in the 10-80 K range. In spite of the photoluminescence enhancement in the resonan ce direction, the results are consistent with an overall excitation de cay process essentially insensitive to the microcavity effect. Evidenc e is also given for a non-thermalization of the excitation in the cavi ty-polariton dispersion relation at least in this temperature range an d large detuning conditions. Copyright (C) 1996 Elsevier Science Ltd