RAMAN-SCATTERING STUDIES ON THE C-60 FILMS DEPOSITED BY IONIZED CLUSTER BEAM DEPOSITION (ICBD) TECHNIQUE

Citation
Y. Shi et al., RAMAN-SCATTERING STUDIES ON THE C-60 FILMS DEPOSITED BY IONIZED CLUSTER BEAM DEPOSITION (ICBD) TECHNIQUE, Solid state communications, 99(6), 1996, pp. 445-449
Citations number
29
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
99
Issue
6
Year of publication
1996
Pages
445 - 449
Database
ISI
SICI code
0038-1098(1996)99:6<445:RSOTCF>2.0.ZU;2-A
Abstract
Experimental results on Raman-scattering spectra taken at room tempera ture of C-60 films deposited by ionized cluster beam deposition (ICBD) technique are presented. The Raman spectra show 10 strong Raman lines , consistent with the 10 Raman-allowed (2A(g)+8H(g)) modes predicted f or isolated C-60 molecule. A broad feature at high frequency, which va ries with acceleration voltage (Va). is also observed and is attribute d to amorphous carbon (a-C). The formation and influence of a-C in the ICBD C-60 films are discussed. We think the ICBD technique is very us eful in preparing dense and homogeneous pristine C-60 films with stabl e properties in air. Copyright (C) 1996 Published by Elsevier Science Ltd