The linear polarization of resonance vacuum-ultraviolet (VUV) radiatio
n emitted by electron-impact excited Ar, Kr, and Xe atoms has been mea
sured in the energy range from threshold to 480 eV using two sets of a
pparatus. The first apparatus measured the polarization function in th
e near-threshold region using an energy selected electron beam with a
resolution of 160 meV. This enabled the effects of negative-ion resona
nces on the polarization function to be examined in detail. Prediction
s of the effects of negative-ion resonances on the observed polarizati
ons have been made using a generalized Baranger-Gerjuoy theory. Excita
tion via electron exchange is shown to be a significant process very c
lose to threshold. The second apparatus used an electron beam with sim
ilar to 1 eV resolution to probe the broad features of the VUV polariz
ation functions over the energy range from threshold to 480 eV. Measur
ements are compared with other published data.