INCLUSION DETECTION ANALYSIS IN RECTANGULAR DIELECTRIC STRUCTURES USING THE FINITE-DIFFERENCE TIME-DOMAIN TECHNIQUE

Citation
Pc. Subedi et I. Chatterjee, INCLUSION DETECTION ANALYSIS IN RECTANGULAR DIELECTRIC STRUCTURES USING THE FINITE-DIFFERENCE TIME-DOMAIN TECHNIQUE, Journal of electromagnetic waves and applications, 10(6), 1996, pp. 845-870
Citations number
20
Categorie Soggetti
Physycs, Mathematical","Physics, Applied","Engineering, Eletrical & Electronic
ISSN journal
09205071
Volume
10
Issue
6
Year of publication
1996
Pages
845 - 870
Database
ISI
SICI code
0920-5071(1996)10:6<845:IDAIRD>2.0.ZU;2-J
Abstract
This paper describes a study which has shown the feasibility of using a Finite-Difference Time-Domain software package TSAR (Temporal Scatte ring and Response) to generate far-field scattered electric field patt erns for the remote detection of dielectric and metallic inclusions in homogeneous dielectric structures. The far-field scattered patterns o f a homogeneous dielectric structure of rectangular cross section, rep resenting a typical rock sample whose dielectric properties have been measured were calculated using TSAR. Inclusions, both dielectric and m etallic, of various sizes were placed at different locations in this h omogeneous sample. The calculations showed that it was indeed possible to detect the presence, the size, type and location of these inclusio ns to sizes as small as 0.067% of the total sample volume: by observin g the scattered electric field patterns. An application of this study would eventually be for the inverse scattering problem of microwave re mote detection of minerals in rocks.