SOFT-ERROR SIMULATION SYSTEM AND APPLICATION TO SRAM DESIGN

We developed a soft-error simulation system which does not need any fi tting parameter. We also proposed a new noise current model which is s uitable for any transistor structure and alpha particle incident condi tion. The soft-error rates of the prediction and an accelerated measur ement agreed within one order of the magnitude. Our system can predict the soft-error rates induced by the localized alpha source such as th e solder bump, which can not be estimated from the accelerated measure ment. Our soft-error simulation system is useful for the SRAM cell des ign.