Experiments on interface reactions occurring even at low temperatures
(e.g. 77 K) and resulting in metastable amorphous layers restricted to
a small depth of typically 3 nm are reviewed. This phenomenon can be
exploited to prepare thick amorphous films by stacking bilayers with a
modulation length smaller than the reaction depth. With emphasis on t
he In/Pd system, additional experimental results are provided on the l
ong-range diffusion as well as on the reaction behaviour on single-cry
stalline substrates. For this latter point, a combination of Auger and
electron energy loss spectroscopy has been applied. The results indic
ate a clear difference to systems exhibiting a solid-state amorphisati
on reaction like Zr/Co.