MULTILAYERS - A WAY TO PREPARE METASTABLE PHASES BY MULTIPLE INTERFACE REACTIONS

Citation
A. Siber et al., MULTILAYERS - A WAY TO PREPARE METASTABLE PHASES BY MULTIPLE INTERFACE REACTIONS, Thin solid films, 275(1-2), 1996, pp. 73-77
Citations number
25
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
275
Issue
1-2
Year of publication
1996
Pages
73 - 77
Database
ISI
SICI code
0040-6090(1996)275:1-2<73:M-AWTP>2.0.ZU;2-1
Abstract
Experiments on interface reactions occurring even at low temperatures (e.g. 77 K) and resulting in metastable amorphous layers restricted to a small depth of typically 3 nm are reviewed. This phenomenon can be exploited to prepare thick amorphous films by stacking bilayers with a modulation length smaller than the reaction depth. With emphasis on t he In/Pd system, additional experimental results are provided on the l ong-range diffusion as well as on the reaction behaviour on single-cry stalline substrates. For this latter point, a combination of Auger and electron energy loss spectroscopy has been applied. The results indic ate a clear difference to systems exhibiting a solid-state amorphisati on reaction like Zr/Co.