G. Gladyszewski et Y. Bruynseraede, MONTE-CARLO SIMULATION OF NON-SPECULAR X-RAY-SCATTERING PROFILES FROMMULTILAYERED STRUCTURES, Thin solid films, 275(1-2), 1996, pp. 184-187
A simple model for calculating non-specular X-ray scattering profiles
from non-ideal multilayers is proposed. A Monte Carlo method is used t
o simulate a ''imperfect'' multilayer structure. Non-specular profiles
are calculated using the kinematical theory of scattering. The influe
nce of uncorrelated, laterally correlated, and vertically correlated i
nterface roughness on omega-scans is studied.