Hr. Khan et al., CRYSTALLOGRAPHIC AND MAGNETIC INVESTIGATIONS OF THE COBALT COLUMNS ELECTRODEPOSITED IN THE PORES OF ANODIC ALUMINA, Thin solid films, 275(1-2), 1996, pp. 207-209
Textured polycrystalline cobalt columns are electrochemically deposite
d in the pores of anodic alumina layers of 15 mu m thickness. X-ray di
ffraction investigations show that the cobalt columns are polycrystall
ine and textured. The crystallite size of the cobalt columns is about
80 nm and the c axis is oriented at an angle of about 60 degrees towar
ds the layer surface. The layers show perpendicular magnetization anis
otropy. Anomalies in the magnetization parameters such as saturation m
agnetization, coercivity and the area of the magnetization hysteresis
loop around an angle of 40 degrees are also observed. Maximum coercivi
ty of 1.40 kO(c) and a M(r)/M(s) ratio of 0.714 are observed for the m
echanically polished AlMg1 substrate before anodic oxidation. The crys
tallographic and magnetic data further suggest a possibility that perp
endicular magnetic anisotropy of the layers is caused by the cobalt co
lumns perpendicular to the layer surface rather than c-axis orientatio
n of polycrystalline cobalt columns.