MOSSBAUER CHARACTERIZATION OF FEN THIN-FILMS PREPARED BY REACTIVE EVAPORATION

Authors
VERGNAT M BAUER P CHATBI H MARCHAL G
Citation
M. Vergnat et al., MOSSBAUER CHARACTERIZATION OF FEN THIN-FILMS PREPARED BY REACTIVE EVAPORATION, Thin solid films, 275(1-2), 1996, pp. 251-253
Citations number
9
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
275
Issue
1-2
Year of publication
1996
Pages
251 - 253
Database
ISI
SICI code
0040-6090(1996)275:1-2<251:MCOFTP>2.0.ZU;2-E
Abstract
Thin films of iron nitrides were prepared by reactive evaporation and characterized by Mossbauer spectrometry. By varying the elaboration pa rameters, it was possible to obtain an iron phase with perpendicular m agnetic anisotropy, iron atoms with a hyperfine field as large as 374 kOe or the pure Fe4N phase.