SURFACE-STRUCTURE CHARACTERIZATION BY PHOTOELECTRON HOLOGRAPHY

Authors
ZHARNIKOV M WEINELT M ZEBISCH P STEINRUCK HP
Citation
M. Zharnikov et al., SURFACE-STRUCTURE CHARACTERIZATION BY PHOTOELECTRON HOLOGRAPHY, Thin solid films, 275(1-2), 1996, pp. 266-269
Citations number
23
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
275
Issue
1-2
Year of publication
1996
Pages
266 - 269
Database
ISI
SICI code
0040-6090(1996)275:1-2<266:SCBPH>2.0.ZU;2-H
Abstract
The applicability of photoelectron holography to determine the structu re of clean and adsorbate-covered metal surfaces is investigated. The real space structure of various systems is reconstructed from photoele ctron diffraction patterns at various kinetic energies using (1) the s ingle wavenumber and (2) the multiple wavenumber reconstruction algori thm. It is demonstrated that adsorption sites can be unequivocally ide ntified using the multiple wavenumber approach.