The thermal diffusivity of pseudobinary Hg1-xZnxTe solids and melts wa
s measured by the laser flash method. The measured diffusivities for t
he solids of 0.10 less than or equal to x less than or equal to 0.30 a
re about 60% of that of the HgTe solid. Those for the melts rise rapid
ly with temperature but less so with increasing x. For x=0.30, the dif
fusivity of the melt is about one third of that of the HgTe melt. Usin
g the calculated heat capacity data from the associated solution model
and measured density values, the thermal conductivity for the pseudob
inary Hg1-xZnxTe solids of 0.10 less than or equal to x less than or e
qual to 0.30 and for the melts of x = 0.10, 0.16, and 0.30 was determi
ned. (C) 1996 American Institute of Physics.