Acceptorlike states with energy levels in the lower part of the band g
ap have been observed by photocapacitance measurements in Si-doped mol
ecular-beam-epitaxial-grown AlxGa1-xAs (x=0.30-0.59), The microscopic
structure of these defects is still unclear. Their concentration, howe
ver, can exceed the net donor concentration. The energy positions of t
he acceptorlike states as well as their photoionization cross sections
,of holes and electrons have been studied for different x. Due to thei
r large concentration, these states may disturb experiments performed
on DX centers which are often assumed to be the main electronic levels
in these materials. (C) 1996 American Institute of Physics.