Raman spectroscopy is used to investigate strong band bending at the i
nterface in semi-insulating substrates of ZnSe/GaAs heterostructures g
rown at high epitaxy rates. Direct evidence is given of the enhancemen
t of polar modes strength, on the substrate side, by the electric fiel
d of the space-charge zone associated with Fermi-level pinning. The la
tter is qualitatively analyzed by following band flattening under illu
mination through the evolution of interfacial coupled LO-phonon-plasmo
n modes. Corresponding Raman line shapes are discussed within the phen
omenological approach of D. H. Hon and W. L. Faust [Appl. Phys. 1, 241
1 (1973)]. (C) 1996 American Institute of Physics.