G. Decesare et al., VARIABLE SPECTRAL RESPONSE PHOTODETECTOR BASED ON CRYSTALLINE AMORPHOUS SILICON HETEROSTRUCTURE/, Journal of non-crystalline solids, 200, 1996, pp. 1189-1192
A novel photodetector based on a p-i-n amorphous silicon/n-p crystalli
ne silicon stacked heterostructure, which exhibits either infrared or
visible response, depending on the polarity of the applied bias is des
cribed. The energy gap and the thickness of the layers inside amorphou
s diode have been optimized to obtain a wavelength selection (centered
at 480 nm and 780 nm) with high rejection ratio and good quantum effi
ciencies. Absolute values of the quantum yield as high as 80% in both
the two spectral bands have been obtained thanks to an Al-doped ZnO co
nductivity transparent film deposited on the top of the device.