VARIABLE SPECTRAL RESPONSE PHOTODETECTOR BASED ON CRYSTALLINE AMORPHOUS SILICON HETEROSTRUCTURE/

Citation
G. Decesare et al., VARIABLE SPECTRAL RESPONSE PHOTODETECTOR BASED ON CRYSTALLINE AMORPHOUS SILICON HETEROSTRUCTURE/, Journal of non-crystalline solids, 200, 1996, pp. 1189-1192
Citations number
8
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
200
Year of publication
1996
Part
2
Pages
1189 - 1192
Database
ISI
SICI code
0022-3093(1996)200:<1189:VSRPBO>2.0.ZU;2-M
Abstract
A novel photodetector based on a p-i-n amorphous silicon/n-p crystalli ne silicon stacked heterostructure, which exhibits either infrared or visible response, depending on the polarity of the applied bias is des cribed. The energy gap and the thickness of the layers inside amorphou s diode have been optimized to obtain a wavelength selection (centered at 480 nm and 780 nm) with high rejection ratio and good quantum effi ciencies. Absolute values of the quantum yield as high as 80% in both the two spectral bands have been obtained thanks to an Al-doped ZnO co nductivity transparent film deposited on the top of the device.