A MICROBEAM NEGATIVE-ION SOURCE BASED ON A MODIFIED HICONEX(TM) SOURCE

Citation
Sh. Sie et al., A MICROBEAM NEGATIVE-ION SOURCE BASED ON A MODIFIED HICONEX(TM) SOURCE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 382(1-2), 1996, pp. 299-308
Citations number
14
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
382
Issue
1-2
Year of publication
1996
Pages
299 - 308
Database
ISI
SICI code
0168-9002(1996)382:1-2<299:AMNSBO>2.0.ZU;2-H
Abstract
The first stage of the development of AUSTRALIS, a microbeam AMS syste m at the HIAF laboratory at North Ryde, Sydney has been completed. The system is designed to enable in-situ microanalysis of geological samp les for ultra-traces and for isotropic data for minerals exploration r esearch. The negative ions for analysis are produced by sputtering wit h a microbeam of Cs+. This primary microbeam source was developed by m odifying a General Ionex model 834 HICONEX ion source and combining it with auxiliary cylindrical lenses. The Cs beam bombards the sample at 45 degrees incidence angle and the secondary ions are extracted at no rmal angle. The source features a novel intermediate or ''screen'' ele ctrode to correct for the effect of the secondary ion extraction field on the trajectory of the primary beam, in order to bring the primary beam to the geometric centre. The high energy analysis system of AUSTR ALIS features a pair of deflector systems to permit fast switching of isotopes without altering the magnet setting. The paper describes the initial tests' results showing good agreement with the design paramete rs.