Sh. Sie et al., A MICROBEAM NEGATIVE-ION SOURCE BASED ON A MODIFIED HICONEX(TM) SOURCE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 382(1-2), 1996, pp. 299-308
The first stage of the development of AUSTRALIS, a microbeam AMS syste
m at the HIAF laboratory at North Ryde, Sydney has been completed. The
system is designed to enable in-situ microanalysis of geological samp
les for ultra-traces and for isotropic data for minerals exploration r
esearch. The negative ions for analysis are produced by sputtering wit
h a microbeam of Cs+. This primary microbeam source was developed by m
odifying a General Ionex model 834 HICONEX ion source and combining it
with auxiliary cylindrical lenses. The Cs beam bombards the sample at
45 degrees incidence angle and the secondary ions are extracted at no
rmal angle. The source features a novel intermediate or ''screen'' ele
ctrode to correct for the effect of the secondary ion extraction field
on the trajectory of the primary beam, in order to bring the primary
beam to the geometric centre. The high energy analysis system of AUSTR
ALIS features a pair of deflector systems to permit fast switching of
isotopes without altering the magnet setting. The paper describes the
initial tests' results showing good agreement with the design paramete
rs.