SUBSTRATE-MEDIATED ANISOTROPY OF TRANSPORT-PROPERTIES IN YBA2CU3O7-DELTA THIN-FILMS

Citation
T. Haage et al., SUBSTRATE-MEDIATED ANISOTROPY OF TRANSPORT-PROPERTIES IN YBA2CU3O7-DELTA THIN-FILMS, Solid state communications, 99(8), 1996, pp. 553-557
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
99
Issue
8
Year of publication
1996
Pages
553 - 557
Database
ISI
SICI code
0038-1098(1996)99:8<553:SAOTIY>2.0.ZU;2-X
Abstract
We have generated an almost periodic step structure of c-axis-oriented YBa2Cu3O7-delta films grown on 10 degrees miscut SrTiO3(001) substrat es. Combined scanning tunneling microscopy and cross-sectional transmi ssion electron microscopy studies reveal that this growth morphology i s linked to an anisotropic defect microstructure. We present evidence that translational boundaries contribute to strong flux pinning in our films. The resistivity and critical current density in the miscut-gro wn YBa2Cu3O7-delta films have been found to be anisotropic. Copyright (C) 1996 Published by Elsevier Science Ltd