T. Haage et al., SUBSTRATE-MEDIATED ANISOTROPY OF TRANSPORT-PROPERTIES IN YBA2CU3O7-DELTA THIN-FILMS, Solid state communications, 99(8), 1996, pp. 553-557
We have generated an almost periodic step structure of c-axis-oriented
YBa2Cu3O7-delta films grown on 10 degrees miscut SrTiO3(001) substrat
es. Combined scanning tunneling microscopy and cross-sectional transmi
ssion electron microscopy studies reveal that this growth morphology i
s linked to an anisotropic defect microstructure. We present evidence
that translational boundaries contribute to strong flux pinning in our
films. The resistivity and critical current density in the miscut-gro
wn YBa2Cu3O7-delta films have been found to be anisotropic. Copyright
(C) 1996 Published by Elsevier Science Ltd