H. Shimada et al., DETERMINATION OF EXTERNAL SURFACE-COMPOSITION OF ZEOLITE PARTICLES BYSYNCHROTRON-RADIATION XPS, Catalysis letters, 39(1-2), 1996, pp. 125-128
Non-destructive depth profiling analysis with high surface sensitivity
was performed by XPS with synchrotron radiation excitation. Compariso
n of the measured atomic ratios with the simulated ones revealed the p
resence of a thin Al- and Na-rich overlayer at the external surface of
NaY particles. For HY zeolite particles, a gradual decrease in the Al
/Si ratio from the external surface to the bulk was observed.