NEW ERBIUM SILICIDE SUPERSTRUCTURES - A STUDY BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

Authors
FRANGIS N VANTENDELOO G VANLANDUYT J KALTSAS G TRAVLOS A NASSIOPOULOS AG
Citation
N. Frangis et al., NEW ERBIUM SILICIDE SUPERSTRUCTURES - A STUDY BY HIGH-RESOLUTION ELECTRON-MICROSCOPY, Physica status solidi. a, Applied research, 158(1), 1996, pp. 107-116
Citations number
17
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
158
Issue
1
Year of publication
1996
Pages
107 - 116
Database
ISI
SICI code
0031-8965(1996)158:1<107:NESS-A>2.0.ZU;2-D
Abstract
Erbium silicide thin films are grown on Si(100) substrates under high vacuum by single deposition of Er or co-deposition of Er and Si, follo wed by annealing. Electron microscopy revealed for both preparations t he existence of at least three new types of structural phases of erbiu m silicide. One has a tetragonal ThSi2 type structure; the other two a re orthorhombic superstructures of the first one resulting from orderi ng of vacancies on the Si sublattice, which leads to a composition of ErSi2-x (0 < x < 0.5).