The effect of amphoteric impurity states, which are partially filled w
ith electrons, on defect formation in narrow-gap semiconductors is inv
estigated for the example of In impurity and PbTe. On the basis of exp
erimental data on self-compensation in the system PbTe:In,Te-ex, the d
ependence of the density n(upsilon) of compensating lead vacancies on
the In impurity content in the samples is calculated in a thermodynami
c theory. The calculations indicate that the energy position of the am
photeric level strongly influences the character of the defect-formati
on process. Not only can the density of compensating defects increase
(self-compensation phenomenon), but also their density can be independ
ent and n(upsilon) can even decrease as the impurity concentration inc
reases. (C) 1996 American Institute of Physics.