A SIMULATION STUDY OF MULTI-ATOM TIPS AND ESTIMATION OF RESOLUTION INATOMIC-FORCE MICROSCOPY

Authors
BANERJEE S SANYAL MK DATTA A
Citation
S. Banerjee et al., A SIMULATION STUDY OF MULTI-ATOM TIPS AND ESTIMATION OF RESOLUTION INATOMIC-FORCE MICROSCOPY, Applied surface science, 99(3), 1996, pp. 255-260
Citations number
22
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
99
Issue
3
Year of publication
1996
Pages
255 - 260
Database
ISI
SICI code
0169-4332(1996)99:3<255:ASSOMT>2.0.ZU;2-S
Abstract
The structure of the atomic arrangement at the apex of the tip plays a n important role in the atomic force microscope (AFM) images. Computer topographs of the sample surface were simulated with various tip stru ctures at the apex. We have described a scheme to estimate the lower l imit of the lateral resolution of AFM with a mono-atomic tip. It is ob served that in the contact mode of operation, resolution and sensitivi ty of AFM is comparable to that of STM.