M. Dueweke et al., SELF-ASSEMBLING ELECTRICAL CONNECTIONS BASED ON THE PRINCIPLE OF MINIMUM RESISTANCE, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 54(1), 1996, pp. 496-506
We study self-constructing and self-repairing electrical connections b
uilt by agglomeration of metallic particles between two electrodes. Ou
r experiments show that self-assembling electrical connections grow by
building a chain of particles between two electrodes immersed in a di
electric liquid. We find that the growth time for the self-assembling
process is a linear function of the initial average spacing of metalli
c particles and a linear function of the distance between the electrod
es. Furthermore, the experiments demonstrate the ability of the electr
ical connection to self-repair following small perturbations. We show
that the agglomeration process occurs in such a way as to minimize the
overall resistance of the system. We discuss possible future applicat
ions of this phenomenon for fabricating nanoscale circuits.