SOFT-X-RAY RESONANT RAMAN AND RESONANT AUGER-SPECTRA IN SI-K ABSORPTION-EDGE

Si KLL Auger spectra and Ka x-ray emission spectra of Si and SiO2 exci ted at the incident photon energies around the Si K edge were measured . For Si, evolution of the Auger spectra across the K edge and that of the K alpha emission spectra are apparently the same. While for SiO2, a distinct difference between evolution of the Auger spectra and that of the x-ray emission spectra is found, i.e. no x-ray emission peak s howing linear dispersion is observed above the edge.