TOWARD TRUE SURFACE RECOVERY - STUDYING DISTORTIONS IN SCANNING PROBEMICROSCOPY IMAGE DATA

It is known that scanning probe image data are distorted by the geomet ry of the probe and its interaction with the sample. Here, we describe the application of a new method for obtaining information on tip shap e from scanning probe topographic image without a priori assumptions o f tip or sample geometry. The results obtained from image data acquire d from polymeric and semiconductor samples indicate that-this tip info rmation is distorted by the interaction between the imaging probe and the sample surface. Analysis of a series of data, acquired at differen t, scan speeds and forces, reveals the complex relationship between th ese associative phenomena and demonstrate that new methods for scannin g probe surface reconstruction are required.