A WEIGHTED RANDOM PATTERN TEST-GENERATION SYSTEM

Authors
KAPUR R PATIL S SNETHEN TJ WILLIAMS TW
Citation
R. Kapur et al., A WEIGHTED RANDOM PATTERN TEST-GENERATION SYSTEM, IEEE transactions on computer-aided design of integrated circuits and systems, 15(8), 1996, pp. 1020-1025
Citations number
19
Categorie Soggetti
Computer Application, Chemistry & Engineering","Computer Science Hardware & Architecture
Journal title
IEEE transactions on computer-aided design of integrated circuits and systems → ACNP
ISSN journal
02780070
Volume
15
Issue
8
Year of publication
1996
Pages
1020 - 1025
Database
ISI
SICI code
0278-0070(1996)15:8<1020:AWRPTS>2.0.ZU;2-H
Abstract
This paper describes a weight generation algorithm that is driven by t ests created by a test generator. New concepts with regard to throwing away ineffective weight sets are developed as an integral part of the system. Various parameters that help improve the effectiveness of the weight generation system are discussed.