Ebm. Steers et Ap. Thorne, HIGH-RESOLUTION FTS STUDIES OF GLOW-DISCHARGE SPECTRA LINE-PROFILES AND LINE WIDTHS, Fresenius' journal of analytical chemistry, 355(7-8), 1996, pp. 868-872
High resolution studies using Fourier transform spectrometry of the sp
ectra emitted in the visible and ultraviolet regions by a microwave bo
osted glow discharge source have shown that when the source is operate
d in the dc (unboosted) mode, two anomalous forms of line profile occu
r for some analyte elements. (1) Some Fe I lines appear to have a tria
ngular base of half-width about five times greater than that of the li
ne proper. (2) Some Fe II and Ti II lines exhibit satellites about 8 c
m(-1) wide and an intensity of up to 2% of the peak value on either si
de of the main line. Both effects depend on the carrier gas and its pr
essure and are much less pronounced or even absent in the boosted mode
. They could both affect the accuracy of analytical results, particula
rly for depth-profiling. Further studies are in progress.