Xq. Jiang et al., ACCURATE WAVELENGTH DETERMINATION IN A WOLLASTON INTERFEROMETER FOR SENSOR APPLICATIONS, IEEE photonics technology letters, 8(8), 1996, pp. 1055-1057
A novel wavelength measurement scheme, for practical wavelength-depend
ent optical sensor applications, configured with the use of an additio
nal known wavelength as a self-reference to achieve high measurement a
ccuracy over a range of tens of nanometers is described and presented.