NANOSTRUCTURE FABRICATION USING THE SELECTIVE THERMAL-DESORPTION OF SIO2 INDUCED BY ELECTRON-BEAMS

Citation
S. Fujita et al., NANOSTRUCTURE FABRICATION USING THE SELECTIVE THERMAL-DESORPTION OF SIO2 INDUCED BY ELECTRON-BEAMS, Applied physics letters, 69(5), 1996, pp. 638-640
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
5
Year of publication
1996
Pages
638 - 640
Database
ISI
SICI code
0003-6951(1996)69:5<638:NFUTST>2.0.ZU;2-A
Abstract
It has been found that selective thermal desorption of SiO2 on Si (111 ) substrate is induced by electron-beam irradiation. By using this sel ective thermal desorption, a nanofabrication technique has been realiz ed by focused electron beams. Open windows of 10 nm width in a SiO2 fi lm have been fabricated by this technique. A pattern transfer from the open windows to thin Si films has also been performed by Si growth an d subsequent heating. This has produced Si wires of 10 nm width. (C) 1 996 American Institute of Physics.