ENERGY-FILTERING TEM AND ELECTRON-ENERGY-LOSS SPECTROSCOPY OF DOUBLE STRUCTURE TABULAR MICROCRYSTALS OF SILVER-HALIDE EMULSIONS

Citation
V. Oleshko et al., ENERGY-FILTERING TEM AND ELECTRON-ENERGY-LOSS SPECTROSCOPY OF DOUBLE STRUCTURE TABULAR MICROCRYSTALS OF SILVER-HALIDE EMULSIONS, Journal of Microscopy, 183, 1996, pp. 27-38
Citations number
58
Categorie Soggetti
Microscopy
Journal title
ISSN journal
00222720
Volume
183
Year of publication
1996
Part
1
Pages
27 - 38
Database
ISI
SICI code
0022-2720(1996)183:<27:ETAESO>2.0.ZU;2-Q
Abstract
Composite Ag(Br,I) tabular microcrystals of photographic emulsions wer e studied by the combination of energy-filtering electron microscopy ( EFTEM) and electron energy-loss spectroscopy (EELS) in conjunction wit h energy-dispersive X-ray (EDX) microanalysis. The contrast tuning und er the energy-filtering in the low-loss region was used to observe mor e clearly edge and random dislocations, {11(1) over bar} stacking faul ts in the grain shells parallel to {11(2) over bar} edges and bend and edge contours. Electron spectroscopic diffraction patterns revealed n umerous extra reflections at commensurate positions in between the Bra gg reflections and diffuse honeycomb contours; these were assigned to the number of defects in the shell region parallel to the grain edges and polyhedral clusters of interstitial silver cations, respectively, Inner-shell excitation bands of silver halide were detected and confir med by EDX analyses, i.e. the Ag N-2,N-3 edge at 62 eV (probably overl apped with the weak I N-4,N-5 edge at 52 eV and the Br M(4,5) edge at 70 eV), the I M(4,5) edge at about 620 eV, and the Br L(2,3) edge at a bout 1550 eV energy losses. Energy-loss near-edge structure of the Ag M(4,5) edge at about 367 eV energy losses and low-loss fine structure arisen as a result of interband transitions and excitons, possibly sup erimposed with many electron effects, have been revealed, The crystal thickness was determined by a modified EELS log-ratio technique in sat isfactory agreement with measurements on grain replicas.