SPIN-POLARIZED SCANNING PROBE MICROSCOPY

Authors
LAIHO R REITTU H
Citation
R. Laiho et H. Reittu, SPIN-POLARIZED SCANNING PROBE MICROSCOPY, Fizika tverdogo tela, 38(3), 1996, pp. 918-929
Citations number
29
Categorie Soggetti
Physics, Condensed Matter
Journal title
Fizika tverdogo tela → ACNP
ISSN journal
03673294
Volume
38
Issue
3
Year of publication
1996
Pages
918 - 929
Database
ISI
SICI code
0367-3294(1996)38:3<918:SSPM>2.0.ZU;2-M
Abstract
Possibility of spin-polarized scanning probe microscopy using a semico nductor tip illuminated with circularly polarized light is theoretical ly discussed. Both spin-polarized scanning tunneling microscopy and sp in-polarized force microscopy are considered. Critical evaluation of w orking conditions and tip materials suggest that they may provide mean s to investigate magnetic surface properties of solids with a very hig h resolution.