Sv. Golovin et al., PROPERTIES OF EPITAXIAL CDXHG1-XTE LAYERS GROWN FROM THE VAPOR-PHASE IN A QUASI-CLOSED SYSTEM, Journal of optical technology, 63(6), 1996, pp. 462-463
This paper describes the electrical properties of epitaxial CdxHg1-xTe
(0.2 less than or equal to x less than or equal to 0.3) layers grown
by the evaporation-condensation-diffusion method in a quasi-closed vol
ume in an argon atmosphere. The epitaxial layers are shown to be suite
d for the production of multielement photodiode IR detectors. (C) 1996
The Optical Society of America.