BROADENING OF RESONANCE LEVEL INDUCED BY INTERFACE ROUGHNESS SCATTERING IN DOUBLE-BARRIER TUNNELING STRUCTURES

Citation
T. Hoshida et al., BROADENING OF RESONANCE LEVEL INDUCED BY INTERFACE ROUGHNESS SCATTERING IN DOUBLE-BARRIER TUNNELING STRUCTURES, Surface science, 362(1-3), 1996, pp. 222-225
Citations number
11
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
362
Issue
1-3
Year of publication
1996
Pages
222 - 225
Database
ISI
SICI code
0039-6028(1996)362:1-3<222:BORLIB>2.0.ZU;2-A
Abstract
Energy spectral line shapes of resonance slates in double barrier (DB) structures have been studied using(a) tunneling spectroscopy measurem ents and (b) a semi-quantitative theoretical analysis on elastic scatt ering by hetero-interface roughness (IR). Obvious broadening in resona nce levels were observed when interface morphology was modified by int erface smoothing time periods during molecular beam epitaxy, IR scatte ring probability calculation suggested that such broadening could be a ttributed to enhanced dephasing of vertical momentum induced by the IR scattering inside the quantum well of DB.