A. Theuwis et al., CHEMICAL AND ELECTROCHEMICAL INTERACTION OF ACIDIC H2O2 SOLUTIONS WITH (100)INP, Journal of electroanalytical chemistry [1992], 410(1), 1996, pp. 31-42
The chemical and electrochemical interactions between the (100) InP su
rface and acidic aqueous H2O2 solutions were studied by etch rate, vol
tammetric, IMPS and electroluminescence measurements. Etching of InP b
y H2O2 appears to occur at a very low rate through a chemical mechanis
m. Photocurrent enhancement caused by H2O2 is observed both at the p-I
nP cathode and at the n-InP anode. Whereas the former effect is ascrib
ed to reduction of H2O2 by the well-known current-doubling mechanism,
for the latter effect a reaction mechanism is proposed in which interm
ediates of the photoanodic dissolution reaction of InP are modified by
H2O2 so that they can more easily inject electrons into the conductio
n band of the semiconductor.