Kg. Vandervoort et al., SCANNING TUNNELING MICROSCOPE IMAGES OF GRAPHITE SUBSTRATES USED IN GRAPHITE-FURNACE ATOMIC-ABSORPTION SPECTROMETRY, Applied spectroscopy, 50(7), 1996, pp. 928-938
Scanning tunneling microscopy (STM) was used to elucidate the submicro
meter defect structures on the graphite substrates used in graphite fu
rnace atomic absorption spectrometry (GFAAS). Images were obtained on
pristine pyrolytic coated and uncoated polycrystalline graphite tubes
and on pure pyrolytic graphite platforms. For comparison, images of hi
ghly oriented pyrolytic graphite, not used in GFAAS, were also obtaine
d. Polycrystalline tubes were characterized by disordered surfaces wit
h extensive oxidation. Pyrolytic coated tubes and pure pyrolytic graph
ite platforms were characterized by scaled structures, island columns,
or smoothly varying contours, Scaled structures and island columns pr
esented the greatest abundance of exposed carbon edge sites and seemed
probable areas for analyte reactivity and intercalation. In areas dis
playing smoothly varying contours, atomic imaging revealed basal plane
surface layers with moderate curvature but regular spacing between th
e carbon atoms within the layers. The results imply that the weak orde
ring between graphite layers along the c-axis does not preclude good a
tomic ordering within the layers, and this factor may be sufficient fo
r discouraging analyte-substrate interactions.