WAVE-NUMBER FORMULATION FOR V(Z) CURVES OF LINE-FOCUS ACOUSTIC MICROSCOPY

A stiffness matrix formulation is proposed to incorporate electro-mech anical relations for simulating the V(z) curves of a line-focus acoust ic microscope for layered media. Examples for the layer/substrate conf iguration of polycrystalline ZnO and silicon, which are assumed to be isotropic, are well discussed. Leaky Rayleigh, Sezawa and/or pseudo-Se zawa waves with respect to various layer thicknesses, can be easily mo deled and interpreted from their V(z) curves. Results obtained from di fferent electromechanical relations are also compared.